Accéder directement au contenu Accéder directement à la navigation
Article dans une revue

Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics

Abstract : We quantitatively study interfacial adhesion in a two-layer membrane system consisting of Al and Siwith femtosecond time-resolved laser spectroscopy. High-frequency acoustic pulses in the sub-THz regime are utilized to characterize the membrane system. In order to explain the distinct features ofthe measured data, a spring model for the Al/Si interface is employed. We show that acousticdissipation in this system needs to be included for accurate modeling of the interface adhesion over abroad frequency range.
Liste complète des métadonnées

https://hal-univ-lemans.archives-ouvertes.fr/hal-02536022
Contributeur : Vitali Goussev <>
Soumis le : mardi 7 avril 2020 - 19:34:23
Dernière modification le : vendredi 30 avril 2021 - 17:00:20

Lien texte intégral

Identifiants

Collections

Citation

Martin Grossmann, Martin Schubert, Chuan He, Delia Brick, Elke Scheer, et al.. Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics. New Journal of Physics, Institute of Physics: Open Access Journals, 2017, 19 (5), pp.053019. ⟨10.1088/1367-2630/aa6d05⟩. ⟨hal-02536022⟩

Partager

Métriques

Consultations de la notice

60