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Characterization of thin-film adhesion and phonon lifetimes in Al/Si membranes by picosecond ultrasonics
Abstract : We quantitatively study interfacial adhesion in a two-layer membrane system consisting of Al and Siwith femtosecond time-resolved laser spectroscopy. High-frequency acoustic pulses in the sub-THz regime are utilized to characterize the membrane system. In order to explain the distinct features ofthe measured data, a spring model for the Al/Si interface is employed. We show that acousticdissipation in this system needs to be included for accurate modeling of the interface adhesion over abroad frequency range.
https://hal-univ-lemans.archives-ouvertes.fr/hal-02536022
Contributeur : Vitali Goussev Connectez-vous pour contacter le contributeur
Soumis le : mardi 7 avril 2020 - 19:34:23
Dernière modification le : vendredi 30 avril 2021 - 17:00:20
Contributeur : Vitali Goussev Connectez-vous pour contacter le contributeur
Soumis le : mardi 7 avril 2020 - 19:34:23
Dernière modification le : vendredi 30 avril 2021 - 17:00:20
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